Speaker
Description
Hermetically sealed sample holders are widely used in X-ray diffraction (XRD) analyses when handling sensitive materials. In the case of radioactive samples, these holders provide effective containment to prevent contamination, while for hygroscopic materials, they offer protection against interaction with atmospheric moisture. Despite these advantages, the materials used to manufacture such holders often introduce an amorphous scattering contribution at lower angles, commonly observed as a broad hump in diffraction patterns. This background signal can obscure weak diffraction peaks associated with minority crystalline phases, thereby compromising the accuracy and reliability of phase identification and quantitative analysis.
This study investigates alternative materials for hermetically sealed sample holders aimed at minimising the amorphous background contribution while maintaining the necessary containment and protection properties. A combined experimental and computational approach is employed on selected materials, utilizing XRD data alongside McXTrace ray tracing model to evaluate the scattering characteristics of candidate materials. The results provide insights into the trade-offs between sample protection and diffraction data quality and identify promising materials that enhance the identification of low-intensity peaks due to minor phases. This work contributes to improved analytical accuracy in the characterisation of sensitive materials.
| Apply for student award at which level: | None |
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| Consent on use of personal information: Abstract Submission | Yes, I ACCEPT |