Speaker
Description
This study investigates the charge transport properties of printed silicon nanoparticle networks prepared from high-energy milled silicon. Hall effect measurements, complemented by X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), high-resolution transmission electron microscopy (HRTEM), and DC resistance measurements, were used to examine the influence of milling time and surface chemistry on electronic behaviour. The carrier concentration increased with longer milling times, correlating with an increased fraction of silicon sub-oxides on the nanoparticle surfaces, suggesting a surface-induced doping effect. Despite this increase, Hall mobilities remained nearly constant while pellet resistances increased with milling time. This behaviour indicates that Hall measurements predominantly probe intraparticle charge transport rather than interparticle conduction. Consequently, the overall network conductivity is limited by interparticle contact resistance rather than charge transport within individual nanoparticles. These findings provide critical insight into the design of printed nanoparticle-based electronic devices, highlighting the importance of improving interparticle contacts through surface treatments and thermal processing to enhance electrical performance.
| Apply for student award at which level: | PhD |
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| Consent on use of personal information: Abstract Submission | Yes, I ACCEPT |