Speaker
Description
In this work we propose a technique that is able to measure the intensity dependent refractive index $n_2$ and nonlinear absorption $\beta$ in a single measurement and improved accuracy. Contrary to previous techniques, we are able to improve precision via manipulation of the optical system post interaction with the sample. We achieve this by imprinting on the beam a specific intensity profile that induces a steering and reshaping effect due to the nonlinearity type, which aborts parts of the beam unevenly and displaces the beam center in the far field. We use the near-field profile to measure $\beta$ and the far-field to measure $n_2$. We show analytical solutions with high agreement to numerical simulations. This technique is promising due to the quick measurements, ease to calibrate and shape of the beam, resilience to power oscillations and is especially suitable for thin samples.
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